Abstract
Thin hafnium oxide layers deposited by an atomic layer deposition system were investigated as the sensing membrane of the electrolyte-insulator-semiconductor structure. Moreover, a post-remote NH 3 plasma treatment was proposed to replace the complicated silanization procedure for enzyme immobilization. Compared to conventional methods using chemical procedures, remote NH 3 plasma treatment reduces the processing steps and time. The results exhibited that urea and antigen can be successfully detected, which indicated that the immobilization process is correct.
Original language | English |
---|---|
Journal | Nanoscale Research Letters |
Volume | 7 |
DOIs | |
State | Published - 2012 |
Keywords
- Remote plasma
- Silanization procedure
- Surface functionalization