Impact of yttrium concentration on structural characteristics and pH sensing properties of sol-gel derived Y2O3 based electrolyte-insulator-semiconductor sensor

Kanishk Singh, Bih Show Lou, Jim Long Her, Tung Ming Pan*

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

11 Scopus citations

Abstract

The complementary metal-oxide-semiconductor compatible electrolyte-insulator-semiconductor (EIS) platform is a promising tool for the detection of ions and biomolecules. In this investigation, we fabricated a Y2O3 sensing membrane based EIS pH sensor by Pechini sol-gel method. X-ray diffraction, atomic force microscopy and X-ray photoelectron spectroscopy were implemented to analyze the effect of yttrium concentration (0.1, 0.2 and 0.3 M) on the crystalline structure, surface morphology and chemical composition of the sensing membrane, respectively. The Y2O3 based EIS sensor fabricated under the 0.2 M concentration manifests the near-super-Nernstian pH response (63.80 mV/pH) and high stability in terms of a low hysteresis voltage (5.7 mV) and a small drift rate (0.18 mV/h). We ascribe that the optimal yttrium content increases the surface roughness of the sensing membrane and the formation of a well-crystallized Y2O3 film as well as a stoichiometric Y2O3 film.

Original languageEnglish
Article number104741
JournalMaterials Science in Semiconductor Processing
Volume105
DOIs
StatePublished - 01 2020

Bibliographical note

Publisher Copyright:
© 2019 Elsevier Ltd

Keywords

  • Electrolyte-insulator-semiconductor (EIS)
  • Sol-gel
  • YO sensing film

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