Fingerprint
Dive into the research topics of 'Improved Gate Reliability Normally-Off p-GaN/AlN/AlGaN/GaN HEMT with AlGaN Cap-Layer'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Improved Gate Reliability Normally-Off p-GaN/AlN/AlGaN/GaN HEMT with AlGaN Cap-Layer
Chia Hao Liu, Hsien Chin Chiu*, Hsiang Chun Wang, Hsuan Ling Kao, Chong Rong Haung
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review