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Improved Gate Reliability Normally-Off p-GaN/AlN/AlGaN/GaN HEMT with AlGaN Cap-Layer
- Chia Hao Liu
- , Hsien Chin Chiu*
- , Hsiang Chun Wang
- , Hsuan Ling Kao
- , Chong Rong Haung
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review