Improved percentile estimation for the two-parameter Weibull distribution

  • F. K. Wang*
  • , J. Bert Keats
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

18 Scopus citations

Abstract

This paper presents an improvement of a technique recently published to estimate the parameters of the two-parameter Weibull distribution. A simple percentile method is used to estimate the two parameters. Computer simulation is employed to compare the proposed method with the maximum likelihood estimation and graphical methods results. A set of frequently-used and newer expressions for estimating the cumulative density are examined. Comparisons are made with both complete and censored data. The primary advantage of the method is its computational simplicity. Results indicate that with respect to Mean Square Error and estimation of the characteristic value with complete data, the percentile method cannot outperform the maximum likelihood method, although differences are minor in many instances. However, with censored data, improvements over the maximum likelihood are observed. When the shape parameter is estimated, the percentile method is quite competitive with that of maximum likelihood for both complete and censored data under a variety of conditions.

Original languageEnglish
Pages (from-to)883-892
Number of pages10
JournalMicroelectronics Reliability
Volume35
Issue number6
DOIs
StatePublished - 06 1995
Externally publishedYes

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