Improvement in radiation-hard CMOS logic gates for noise margin

  • S. J. Yih*
  • , M. L. Chang
  • , J. G. Hwu
  • , W. S. Feng
  • *Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

A design technique for fundamental CMOS logic gates that are almost insensitive to noise margin is proposed. An auxiliary circuit is added to the conventional CMOS logic gates. All the circuits are simulated by HSPICE. It is observed from simulation results that good radiation hard behavior appears in the improved inverter, NOR and NAND gates for noise margin, especially for the scaling down on supply voltage VDD.

Original languageEnglish
Pages (from-to)1916-1919
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume3
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1997 IEEE International Symposium on Circuits and Systems, ISCAS'97. Part 4 (of 4) - Hong Kong, Hong Kong
Duration: 09 06 199712 06 1997

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