Influence of electrodeposition potential and heat treatment on structural properties of CdTe films

Shu Ying Yang; Jung Chuan Chou; Herng Yih Ueng

doi:10.1016/j.tsf.2009.12.077

Influence of electrodeposition potential and heat treatment on structural properties of CdTe films

Shu Ying Yang, Jung Chuan Chou, Herng Yih Ueng^*

^*Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

25 Scopus citations

Abstract

A modified Butler-Volmer model is developed to predict the potential of perfect stoichiometry (PPS) for electrodeposition. CdTe thin films are deposited in an acidic solution; their electrodeposition mechanism is investigated using cyclic voltammetry. Calculated and experimental PPS values exhibit good agreement. At PPS, well-connected granular CdTe thin films can be deposited; these are predicted to be intrinsic, and slightly p-type due to cadmium vacancies. Type conversion occurs only because of defect redistribution and local defect reactions after annealing; the converted n-type layer exhibits lower resistivity and higher mobility. A film annealed at 350 °C exhibits excellent crystallization.

Original language	English
Pages (from-to)	4197-4202
Number of pages	6
Journal	Thin Solid Films
Volume	518
Issue number	15
DOIs	https://doi.org/10.1016/j.tsf.2009.12.077
State	Published - 31 05 2010
Externally published	Yes

Keywords

Cadmium telluride
Cyclic voltammetry
Electrodeposition
Potentiostat
Scanning electron microscopy
Stoichiometry
X-ray diffraction

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10.1016/j.tsf.2009.12.077

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title = "Influence of electrodeposition potential and heat treatment on structural properties of CdTe films",

abstract = "A modified Butler-Volmer model is developed to predict the potential of perfect stoichiometry (PPS) for electrodeposition. CdTe thin films are deposited in an acidic solution; their electrodeposition mechanism is investigated using cyclic voltammetry. Calculated and experimental PPS values exhibit good agreement. At PPS, well-connected granular CdTe thin films can be deposited; these are predicted to be intrinsic, and slightly p-type due to cadmium vacancies. Type conversion occurs only because of defect redistribution and local defect reactions after annealing; the converted n-type layer exhibits lower resistivity and higher mobility. A film annealed at 350 °C exhibits excellent crystallization.",

keywords = "Cadmium telluride, Cyclic voltammetry, Electrodeposition, Potentiostat, Scanning electron microscopy, Stoichiometry, X-ray diffraction",

author = "Yang, {Shu Ying} and Chou, {Jung Chuan} and Ueng, {Herng Yih}",

year = "2010",

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doi = "10.1016/j.tsf.2009.12.077",

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volume = "518",

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T1 - Influence of electrodeposition potential and heat treatment on structural properties of CdTe films

AU - Yang, Shu Ying

AU - Chou, Jung Chuan

AU - Ueng, Herng Yih

PY - 2010/5/31

Y1 - 2010/5/31

N2 - A modified Butler-Volmer model is developed to predict the potential of perfect stoichiometry (PPS) for electrodeposition. CdTe thin films are deposited in an acidic solution; their electrodeposition mechanism is investigated using cyclic voltammetry. Calculated and experimental PPS values exhibit good agreement. At PPS, well-connected granular CdTe thin films can be deposited; these are predicted to be intrinsic, and slightly p-type due to cadmium vacancies. Type conversion occurs only because of defect redistribution and local defect reactions after annealing; the converted n-type layer exhibits lower resistivity and higher mobility. A film annealed at 350 °C exhibits excellent crystallization.

AB - A modified Butler-Volmer model is developed to predict the potential of perfect stoichiometry (PPS) for electrodeposition. CdTe thin films are deposited in an acidic solution; their electrodeposition mechanism is investigated using cyclic voltammetry. Calculated and experimental PPS values exhibit good agreement. At PPS, well-connected granular CdTe thin films can be deposited; these are predicted to be intrinsic, and slightly p-type due to cadmium vacancies. Type conversion occurs only because of defect redistribution and local defect reactions after annealing; the converted n-type layer exhibits lower resistivity and higher mobility. A film annealed at 350 °C exhibits excellent crystallization.

KW - Cadmium telluride

KW - Cyclic voltammetry

KW - Electrodeposition

KW - Potentiostat

KW - Scanning electron microscopy

KW - Stoichiometry

KW - X-ray diffraction

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U2 - 10.1016/j.tsf.2009.12.077

DO - 10.1016/j.tsf.2009.12.077

M3 - 文章

AN - SCOPUS:77953148912

SN - 0040-6090

VL - 518

SP - 4197

EP - 4202

JO - Thin Solid Films

JF - Thin Solid Films

IS - 15

ER -

Influence of electrodeposition potential and heat treatment on structural properties of CdTe films

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Keywords

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