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Influence of hydrogenation on surface morphologies, transport, and optical properties of InN epifilms

  • S. P. Fu*
  • , T. J. Lin
  • , W. S. Su
  • , C. Y. Shieh
  • , Y. F. Chen
  • , C. A. Chang
  • , N. C. Chen
  • , P. H. Chang
  • *Corresponding author for this work
  • National Taiwan University
  • Chang Gung University

Research output: Contribution to journalJournal Article peer-review

16 Scopus citations

Abstract

We report the investigation of surface morphologies and transport and optical properties of hydrogenated InN epifilms. The average rms surface roughness decreases from 24 nm on the as-grown sample to 13.2 nm after hydrogenation. The free electron concentration can be increased or decreased depending on the duration of hydrogenation. The linewidth of the photoluminescence spectra can be reduced, and the peak intensity can be enhanced by about three times. All our results indicate that the physical properties of InN films can be improved by hydrogenation. Possible origins of the underlying mechanism have been proposed to explain the improvement.

Original languageEnglish
Article number126102
JournalJournal of Applied Physics
Volume99
Issue number12
DOIs
StatePublished - 2006

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