Influence of patterned sapphire substrates with different symmetry on the light output power of InGaN-based LEDs

Yao Hong You, Vin Cent Su, Ti En Ho, Bo Wen Lin, Ming Lun Lee, Atanu Das, Wen Ching Hsu, Chieh Hsiung Kuan, Ray Ming Lin*

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

10 Scopus citations

Abstract

This paper aims to investigate the light output power (LOP) of InGaN-based light-emitting diodes (LEDs) grown on patterned sapphire substrates (PSSs) with different symmetry. The GaN epitaxial layers grown on the hexagonal lattice arrangement PSS (HLAPSS) have a lower compressive strain than the ones grown on the square lattice arrangement PSS (SLAPSS). The quantum-confined Stark effect (QCSE) is also affected by the residual compressive strain. Based on the experimentally measured data and the ray tracing simulation results, the InGaN-based LED with the HLAPSS has a higher LOP than the one with the SLAPSS due to the weaker QCSE within multiple-quantum wells (MQWs).

Original languageEnglish
Article number596
JournalNanoscale Research Letters
Volume9
Issue number1
DOIs
StatePublished - 2014

Bibliographical note

Publisher Copyright:
© 2014, You et al.; licensee Springer.

Keywords

  • GaN
  • Light-emitting diodes
  • Patterned sapphire substrates
  • Quantum-confined Stark effect

Fingerprint

Dive into the research topics of 'Influence of patterned sapphire substrates with different symmetry on the light output power of InGaN-based LEDs'. Together they form a unique fingerprint.

Cite this