Abstract
This paper aims to investigate the light output power (LOP) of InGaN-based light-emitting diodes (LEDs) grown on patterned sapphire substrates (PSSs) with different symmetry. The GaN epitaxial layers grown on the hexagonal lattice arrangement PSS (HLAPSS) have a lower compressive strain than the ones grown on the square lattice arrangement PSS (SLAPSS). The quantum-confined Stark effect (QCSE) is also affected by the residual compressive strain. Based on the experimentally measured data and the ray tracing simulation results, the InGaN-based LED with the HLAPSS has a higher LOP than the one with the SLAPSS due to the weaker QCSE within multiple-quantum wells (MQWs).
Original language | English |
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Article number | 596 |
Journal | Nanoscale Research Letters |
Volume | 9 |
Issue number | 1 |
DOIs | |
State | Published - 2014 |
Bibliographical note
Publisher Copyright:© 2014, You et al.; licensee Springer.
Keywords
- GaN
- Light-emitting diodes
- Patterned sapphire substrates
- Quantum-confined Stark effect