Abstract
Gallium-doped magnesium zinc oxide (GMZO) thin films were deposited onto glass substrates using RF magnetron sputtering using GMZO ceramic targets under different sputtering conditions. The substrate temperature and deposition pressure effects on the structural, electrical and optical properties of the GMZO thin film were investigated. Transparent conductive GMZO thin films were demonstrated in this study to possess a wurtzite structure, average transmittance above 80% in the 400nm and 800nm wavelength range with a low resistivity of 1.62×10-3Ωcm when deposited onto glass substrates using RF magnetron sputtering.
| Original language | English |
|---|---|
| Pages (from-to) | 539-542 |
| Number of pages | 4 |
| Journal | Surface and Coatings Technology |
| Volume | 231 |
| DOIs | |
| State | Published - 25 09 2013 |
Keywords
- Electrical and optical properties
- Gallium-doped magnesium zinc oxide
- RF magnetron sputtering
- Thin films
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