Abstract
Device modeling is used to generate the entries for the technical correlation matrix. Factor analysis is employed to study the correlation among the various parameters in a device as well as values generated from the device model. The estimation of the communalities between all the parameters are computed using the principal components method. The concept is demonstrated with power diode.
Original language | English |
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Pages (from-to) | 1187-1191 |
Number of pages | 5 |
Journal | Canadian Conference on Electrical and Computer Engineering |
Volume | 2 |
State | Published - 2000 |
Externally published | Yes |
Event | CCECE 2000-Canadian Conference on Electrical and Computer Egineering - Nova Scotia, NS, Can Duration: 07 05 2000 → 10 05 2000 |