Interaction force analysis of transverse flux linear switched reluctance machine by Fourier projection method

Cheng Tsung Liu*, Jian Long Kuo, Ling Fong Chen, Yu Jen Lee, Chia Tu Leu, Yan Nan Chen

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

18 Scopus citations

Abstract

Since the transverse flux linear switched reluctance machine (TFLSRM) [1] has different structure relative to the rotating switched reluctance machine (SRM) system, this paper will propose an efficient finite-element-based Fourier projection method to evaluate its force effect and transient phenomena. Due to the generated thrust and normal forces being two primary sources providing the machine moving operation, the relation between switching status and force change under different conditions will be investigated. The advantages of the proposed technique will be confirmed by simulation results, and the accuracy will also be illustrated with experimental measurements. It is believed that the proposed method will provide a good guidance to the interaction force analysis and the switching control design for related SRM systems.

Original languageEnglish
Pages (from-to)62-69
Number of pages8
JournalIEEE Transactions on Energy Conversion
Volume11
Issue number1
DOIs
StatePublished - 1996
Externally publishedYes

Keywords

  • Finite element analysis
  • Flip-flop effect
  • Fourier projection method
  • Transverse flux linear switched reluctance machine

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