Abstract
With the continuous increasing circuit complexity and the down-scaling of the minimum feature size in integrated circuits (ICs), the electromigration (EM) reliability of ICs is becoming increasingly important. As re-design and re-manufacture are very time- and resource-consuming for present-day, ultra large-scale integration (ULSI), “Design-for-Reliability,” is essential.
Original language | English |
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Pages (from-to) | 1-6 |
Number of pages | 6 |
Journal | SpringerBriefs in Applied Sciences and Technology |
Issue number | 9789814451208 |
DOIs | |
State | Published - 2013 |
Externally published | Yes |
Bibliographical note
Publisher Copyright:© 2013, The Author(s).