Investigate the equivalence of neutrons and protons in single event effects testing: A Geant4 study

Yueh Chiang; Cher Ming Tan; Tsi Chian Chao; Chung Chi Lee; Chuan Jong Tung

doi:10.3390/app10093234

Investigate the equivalence of neutrons and protons in single event effects testing: A Geant4 study

Yueh Chiang, Cher Ming Tan^*, Tsi Chian Chao, Chung Chi Lee, Chuan Jong Tung

^*Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

5 Scopus citations

Abstract

Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming. In this work, we employ Monte Carlo simulation to examine if a proton test can replace or even accelerate the neutron test, and we found that 200 MeV protons are the closest to resembling neutron radiation with five main differences. This 200 MeV concur with the suggestion from National Aeronautics and Space Administration (NASA,Washington, DC, USA). However, the impacts of the five differences on single event effects (SEEs) require future work for examination.

Original language	English
Article number	3234
Journal	Applied Sciences (Switzerland)
Volume	10
Issue number	9
DOIs	https://doi.org/10.3390/app10093234
State	Published - 01 05 2020

Bibliographical note

Publisher Copyright:
© 2020 by the authors.

Keywords

Linear energy transfer
Monte carlo simulation
Radiation hardness
Single event effects

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abstract = "Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming. In this work, we employ Monte Carlo simulation to examine if a proton test can replace or even accelerate the neutron test, and we found that 200 MeV protons are the closest to resembling neutron radiation with five main differences. This 200 MeV concur with the suggestion from National Aeronautics and Space Administration (NASA,Washington, DC, USA). However, the impacts of the five differences on single event effects (SEEs) require future work for examination.",

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AU - Chiang, Yueh

AU - Tan, Cher Ming

AU - Chao, Tsi Chian

AU - Lee, Chung Chi

AU - Tung, Chuan Jong

PY - 2020/5/1

Y1 - 2020/5/1

N2 - Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming. In this work, we employ Monte Carlo simulation to examine if a proton test can replace or even accelerate the neutron test, and we found that 200 MeV protons are the closest to resembling neutron radiation with five main differences. This 200 MeV concur with the suggestion from National Aeronautics and Space Administration (NASA,Washington, DC, USA). However, the impacts of the five differences on single event effects (SEEs) require future work for examination.

AB - Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming. In this work, we employ Monte Carlo simulation to examine if a proton test can replace or even accelerate the neutron test, and we found that 200 MeV protons are the closest to resembling neutron radiation with five main differences. This 200 MeV concur with the suggestion from National Aeronautics and Space Administration (NASA,Washington, DC, USA). However, the impacts of the five differences on single event effects (SEEs) require future work for examination.

KW - Linear energy transfer

KW - Monte carlo simulation

KW - Radiation hardness

KW - Single event effects

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Investigate the equivalence of neutrons and protons in single event effects testing: A Geant4 study

Abstract

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Keywords

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