Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes

Vincent Su; Po Hsun Chen; Ming Lun Lee; Yao Hong You; Cheng Ju Hsieh; Chieh Hsiung Kuan; Yi Chi Chen; Hung Chou Lin; Han Bo Yang; Ray Ming Lin; Quan Yi Lee; Fu Chuan Chu

Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes

Vincent Su, Po Hsun Chen, Ming Lun Lee, Yao Hong You, Cheng Ju Hsieh, Chieh Hsiung Kuan^*, Yi Chi Chen, Hung Chou Lin, Han Bo Yang, Ray Ming Lin, Quan Yi Lee, Fu Chuan Chu

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

This paper demonstrates that the efficiency of InGaN-based light-emitting diodes with nano-post patterned sapphire substrates is superior to that with nano-hole patterned sapphire substrates under the same nano-scale feature owing to reduced quantum-confined stark effect.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	Science and Innovations, CLEO_SI 2013
Pages	JW2A.84
State	Published - 2013
Externally published	Yes
Event	CLEO: Science and Innovations, CLEO_SI 2013 - San Jose, CA, United States Duration: 09 06 2013 → 14 06 2013

Publication series

Name	CLEO: Science and Innovations, CLEO_SI 2013

Conference

Conference	CLEO: Science and Innovations, CLEO_SI 2013
Country/Territory	United States
City	San Jose, CA
Period	09/06/13 → 14/06/13

Cite this

Su, V., Chen, P. H., Lee, M. L., You, Y. H., Hsieh, C. J., Kuan, C. H., Chen, Y. C., Lin, H. C., Yang, H. B., Lin, R. M., Lee, Q. Y., & Chu, F. C. (2013). Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes. In CLEO: Science and Innovations, CLEO_SI 2013 (pp. JW2A.84). (CLEO: Science and Innovations, CLEO_SI 2013).

@inproceedings{043b0c5ba99a407bafb7104f6200f091,

title = "Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes",

abstract = "This paper demonstrates that the efficiency of InGaN-based light-emitting diodes with nano-post patterned sapphire substrates is superior to that with nano-hole patterned sapphire substrates under the same nano-scale feature owing to reduced quantum-confined stark effect.",

author = "Vincent Su and Chen, {Po Hsun} and Lee, {Ming Lun} and You, {Yao Hong} and Hsieh, {Cheng Ju} and Kuan, {Chieh Hsiung} and Chen, {Yi Chi} and Lin, {Hung Chou} and Yang, {Han Bo} and Lin, {Ray Ming} and Lee, {Quan Yi} and Chu, {Fu Chuan}",

year = "2013",

language = "英语",

isbn = "9781557529725",

series = "CLEO: Science and Innovations, CLEO_SI 2013",

pages = "JW2A.84",

booktitle = "CLEO",

note = "CLEO: Science and Innovations, CLEO_SI 2013 ; Conference date: 09-06-2013 Through 14-06-2013",

}

Su, V, Chen, PH, Lee, ML, You, YH, Hsieh, CJ, Kuan, CH, Chen, YC, Lin, HC, Yang, HB, Lin, RM, Lee, QY & Chu, FC 2013, Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes. in CLEO: Science and Innovations, CLEO_SI 2013. CLEO: Science and Innovations, CLEO_SI 2013, pp. JW2A.84, CLEO: Science and Innovations, CLEO_SI 2013, San Jose, CA, United States, 09/06/13.

Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes. / Su, Vincent; Chen, Po Hsun; Lee, Ming Lun et al.
CLEO: Science and Innovations, CLEO_SI 2013. 2013. p. JW2A.84 (CLEO: Science and Innovations, CLEO_SI 2013).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes

AU - Su, Vincent

AU - Chen, Po Hsun

AU - Lee, Ming Lun

AU - You, Yao Hong

AU - Hsieh, Cheng Ju

AU - Kuan, Chieh Hsiung

AU - Chen, Yi Chi

AU - Lin, Hung Chou

AU - Yang, Han Bo

AU - Lin, Ray Ming

AU - Lee, Quan Yi

AU - Chu, Fu Chuan

PY - 2013

Y1 - 2013

N2 - This paper demonstrates that the efficiency of InGaN-based light-emitting diodes with nano-post patterned sapphire substrates is superior to that with nano-hole patterned sapphire substrates under the same nano-scale feature owing to reduced quantum-confined stark effect.

AB - This paper demonstrates that the efficiency of InGaN-based light-emitting diodes with nano-post patterned sapphire substrates is superior to that with nano-hole patterned sapphire substrates under the same nano-scale feature owing to reduced quantum-confined stark effect.

UR - http://www.scopus.com/inward/record.url?scp=84887540239&partnerID=8YFLogxK

M3 - 会议稿件

AN - SCOPUS:84887540239

SN - 9781557529725

T3 - CLEO: Science and Innovations, CLEO_SI 2013

SP - JW2A.84

BT - CLEO

T2 - CLEO: Science and Innovations, CLEO_SI 2013

Y2 - 9 June 2013 through 14 June 2013

ER -

Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes

Abstract

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Conference

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