Investigation of Saturable and Reverse Saturable Absorptions for Graphene by Z-Scan Technique

Pi Ling Huang; Wan Lin Chen; Ta Wei Peng; Ching Yuan Su; Chao Yung Yeh; Wood Hi Cheng

doi:10.1109/LPT.2015.2438230

Investigation of Saturable and Reverse Saturable Absorptions for Graphene by Z-Scan Technique

Pi Ling Huang, Wan Lin Chen, Ta Wei Peng, Ching Yuan Su, Chao Yung Yeh, Wood Hi Cheng

Research output: Contribution to journal › Journal Article › peer-review

16 Scopus citations

Abstract

The optical nonlinear absorption (NLA) property of multilayer graphene was investigated by Z-scan technique with picosecond laser pulse of 532-nm wavelength. Graphene samples were fabricated by chemical vapor deposition (CVD) with different number of layers, which were 1-, 8-, and 16-layer. The dependence of NLA coefficient α (I) on number of layers was investigated under the laser intensity of 7-80 GW/cm². The results showed that α (I) increased as the number of layer increased, and decreased as the laser intensity increased. Nonlinearities of graphene were mainly caused by saturable absorption (SA) effect. The 1-, 8-, and 16-layer graphene exhibited SA nonlinearity. However, reversed SA (RSA) nonlinearity was observed for 16-layer graphene only. The RSA was resulted from two-photon absorption due to layer stacking-induced bandgap opening, confirmed by the α (I) measurement. The RSA may reduce the stability of mode-locking and therefore, it suggests that the lower layer stacking in CVD fabricated graphene is preferable to use as saturable absorbers in laser mode-locking.

Original language	English
Article number	7119559
Pages (from-to)	1791-1794
Number of pages	4
Journal	IEEE Photonics Technology Letters
Volume	27
Issue number	17
DOIs	https://doi.org/10.1109/LPT.2015.2438230
State	Published - 01 09 2015
Externally published	Yes

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Publisher Copyright:
© 1989-2012 IEEE.

Keywords

graphene
nonlinear optical devices
saturable absorber

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10.1109/LPT.2015.2438230

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title = "Investigation of Saturable and Reverse Saturable Absorptions for Graphene by Z-Scan Technique",

abstract = "The optical nonlinear absorption (NLA) property of multilayer graphene was investigated by Z-scan technique with picosecond laser pulse of 532-nm wavelength. Graphene samples were fabricated by chemical vapor deposition (CVD) with different number of layers, which were 1-, 8-, and 16-layer. The dependence of NLA coefficient α (I) on number of layers was investigated under the laser intensity of 7-80 GW/cm2. The results showed that α (I) increased as the number of layer increased, and decreased as the laser intensity increased. Nonlinearities of graphene were mainly caused by saturable absorption (SA) effect. The 1-, 8-, and 16-layer graphene exhibited SA nonlinearity. However, reversed SA (RSA) nonlinearity was observed for 16-layer graphene only. The RSA was resulted from two-photon absorption due to layer stacking-induced bandgap opening, confirmed by the α (I) measurement. The RSA may reduce the stability of mode-locking and therefore, it suggests that the lower layer stacking in CVD fabricated graphene is preferable to use as saturable absorbers in laser mode-locking.",

keywords = "graphene, nonlinear optical devices, saturable absorber",

author = "Huang, \{Pi Ling\} and Chen, \{Wan Lin\} and Peng, \{Ta Wei\} and Su, \{Ching Yuan\} and Yeh, \{Chao Yung\} and Cheng, \{Wood Hi\}",

note = "Publisher Copyright: {\textcopyright} 1989-2012 IEEE.",

year = "2015",

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day = "1",

doi = "10.1109/LPT.2015.2438230",

language = "英语",

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AU - Huang, Pi Ling

AU - Chen, Wan Lin

AU - Peng, Ta Wei

AU - Su, Ching Yuan

AU - Yeh, Chao Yung

AU - Cheng, Wood Hi

PY - 2015/9/1

Y1 - 2015/9/1

N2 - The optical nonlinear absorption (NLA) property of multilayer graphene was investigated by Z-scan technique with picosecond laser pulse of 532-nm wavelength. Graphene samples were fabricated by chemical vapor deposition (CVD) with different number of layers, which were 1-, 8-, and 16-layer. The dependence of NLA coefficient α (I) on number of layers was investigated under the laser intensity of 7-80 GW/cm2. The results showed that α (I) increased as the number of layer increased, and decreased as the laser intensity increased. Nonlinearities of graphene were mainly caused by saturable absorption (SA) effect. The 1-, 8-, and 16-layer graphene exhibited SA nonlinearity. However, reversed SA (RSA) nonlinearity was observed for 16-layer graphene only. The RSA was resulted from two-photon absorption due to layer stacking-induced bandgap opening, confirmed by the α (I) measurement. The RSA may reduce the stability of mode-locking and therefore, it suggests that the lower layer stacking in CVD fabricated graphene is preferable to use as saturable absorbers in laser mode-locking.

AB - The optical nonlinear absorption (NLA) property of multilayer graphene was investigated by Z-scan technique with picosecond laser pulse of 532-nm wavelength. Graphene samples were fabricated by chemical vapor deposition (CVD) with different number of layers, which were 1-, 8-, and 16-layer. The dependence of NLA coefficient α (I) on number of layers was investigated under the laser intensity of 7-80 GW/cm2. The results showed that α (I) increased as the number of layer increased, and decreased as the laser intensity increased. Nonlinearities of graphene were mainly caused by saturable absorption (SA) effect. The 1-, 8-, and 16-layer graphene exhibited SA nonlinearity. However, reversed SA (RSA) nonlinearity was observed for 16-layer graphene only. The RSA was resulted from two-photon absorption due to layer stacking-induced bandgap opening, confirmed by the α (I) measurement. The RSA may reduce the stability of mode-locking and therefore, it suggests that the lower layer stacking in CVD fabricated graphene is preferable to use as saturable absorbers in laser mode-locking.

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KW - nonlinear optical devices

KW - saturable absorber

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M3 - 文章

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JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

IS - 17

M1 - 7119559

ER -

Investigation of Saturable and Reverse Saturable Absorptions for Graphene by Z-Scan Technique

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Keywords

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