Junction temperature measurement of light-emitting diodes by voltage-temperature relation method

Y. K. Yang, W. C. Lien, Y. C. Huang, N. C. Chen*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The voltage-temperature relation of a light-emitting diode is adopted to determine the junction temperature. This study compares two different methods for junction temperature measurement. Both methods yield results are consistent with the largest difference being only 3.5K.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007
PublisherOptical Society of America
ISBN (Print)1424411742, 9781424411740
StatePublished - 2007
EventConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 - Seoul, Korea, Republic of
Duration: 26 08 200726 08 2007

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007
Country/TerritoryKorea, Republic of
CitySeoul
Period26/08/0726/08/07

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