Abstract
The voltage-temperature relation of a light-emitting diode is adopted to determine the junction temperature. This study compares two different methods for junction temperature measurement. Both methods yield results are consistent with the largest difference being only 3.5K.
| Original language | English |
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| Title of host publication | Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 |
| Publisher | Optical Society of America |
| ISBN (Print) | 1424411742, 9781424411740 |
| State | Published - 2007 |
| Event | Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 - Seoul, Korea, Republic of Duration: 26 08 2007 → 26 08 2007 |
Publication series
| Name | Optics InfoBase Conference Papers |
|---|---|
| ISSN (Electronic) | 2162-2701 |
Conference
| Conference | Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 |
|---|---|
| Country/Territory | Korea, Republic of |
| City | Seoul |
| Period | 26/08/07 → 26/08/07 |