Lifetime predictions of LED-based light bars by accelerated degradation test

Fu Kwun Wang*, Tao Peng Chu

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

88 Scopus citations

Abstract

The accelerated degradation of light bars was tested under different stresses called junction temperatures, which result from the combination of current and ambient temperature. Light bars are used as a light source in laptops. A general procedure for an accelerated degradation test was used to analyze the useful lifetime of light bars under operating conditions. The degradation behavior for each light bar was fitted by an exponential function. The impact of parameter variations and measurement errors were also considered. The failure criterion was defined as the 50% decrease of the emitted optical power, when compared with the initial level. The failure time is, accordingly, the time required to achieve that failure criterion. A response model based on an inverse power (exponential) law for the failure time under different stresses was then calculated to predict the lifetime under operating conditions. The results show that the failure time of a light bar under operating conditions is about 11,571 h.

Original languageEnglish
Pages (from-to)1332-1336
Number of pages5
JournalMicroelectronics Reliability
Volume52
Issue number7
DOIs
StatePublished - 07 2012
Externally publishedYes

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