Limiting Factors of RF Performance Improvement as Down-scaling to 65-nm Node MOSFETs

Hsuan-Ling Kao, B. S. Lin, C. C. Liao, M. H. Chen, C. H. Wu, Albert Chin

Research output: Contribution to conferenceProceeding

Original languageAmerican English
StatePublished - 2009
EventKorea-Japan MicroWave Conference - Jeju, Korea (South)
Duration: 01 04 200902 04 2009


ConferenceKorea-Japan MicroWave Conference

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