Linear polarization modulation heterodyne ellipsometer using digital signal processing technique

  • Chih Jen Yu*
  • , Chien Chou
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this research, a novel linear polarization modulation heterodyne ellipsometer (LPMHE) integrated with a digital signal processor is able to measure ellipsometric parameters of a specimen was developed. In this setup, a pair of orthogonally circularly polarized lights with slightly different frequency of the laser beam is used which behaves like a linear polarization rotator at high speed. By integrating with a digital storage oscilloscope, LPMHE is able to real-time measure ellipsometric parameters precisely. When the incident angles of laser beam are set at 60° and 70° in LPMHE, an accuracy of less than 0.7% on ellipsometric parameters measurement of the SiO2 thin film deposited on silicon substrate was demonstrated.

Original languageEnglish
Title of host publicationOptical Components and Materials VIII
DOIs
StatePublished - 2011
EventOptical Components and Materials VIII - San Francisco, CA, United States
Duration: 25 01 201126 01 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7934
ISSN (Print)0277-786X

Conference

ConferenceOptical Components and Materials VIII
Country/TerritoryUnited States
CitySan Francisco, CA
Period25/01/1126/01/11

Keywords

  • dual-frequency laser
  • ellipsometry
  • heterodyne interferometry

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