@article{715235e6814240e99dcf650ddd9149ff,
title = "Low polarization loss of long endurance on scavenged Ru-based electrode ferroelectric Hf0.5Zr0.5O2 by optimizing TiNx interfacial capping layer and its fatigue mechanism",
author = "Siddheswar Maikap and Y.-P. Chen and S.-Y. Huang and J.-Y. Lee and M.-H. Lee and Liu, \{C. W.\} and Z.-F. Lou and Senapati",
note = "公開公告號: IEEE Electron Device Letters Announcement ID: IEEE Electron Device Letters",
year = "2024",
month = apr,
language = "American English",
volume = "45",
pages = "673 -- 676",
journal = "IEEE Electron Device Letters",
issn = "0741-3106",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "4",
}