Low-temperature water gas shift reaction on Cu/SiO2 prepared by an atomic layer epitaxy technique

Ching Shiun Chen*, Jarrn Horng Lin, Tzn Wen Lai

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

31 Scopus citations

Abstract

An atomic layer epitaxy technique was used to produce nanoscale 2.9-3.4 nm copper particles supported on silica, and the nanoscale Cu/SiO2 catalysts can show surprisingly high activity for the water gas shift reaction, in comparison with the 5.6 wt% Pt/SiO2 and 10.3 wt% Cu/SiO 2 prepared by the impregnation method.

Original languageEnglish
Pages (from-to)4983-4985
Number of pages3
JournalChemical Communications
Issue number40
DOIs
StatePublished - 2008

Fingerprint

Dive into the research topics of 'Low-temperature water gas shift reaction on Cu/SiO2 prepared by an atomic layer epitaxy technique'. Together they form a unique fingerprint.

Cite this