Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor

Wei-Han Hsiao; Chun-Yen Yang; Cheng-Shan Chen; Chia-Feng Lin; Deng-Yi Wang; Hsiang Chen; Hsin-Hung Chou; Shao-Jui Yang; Yaw-Wen Kuo; YewChung Sermon Wu; Yung-Hui Li; Jung Han

Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor

Wei-Han Hsiao
, Chun-Yen Yang
, Cheng-Shan Chen
, Chia-Feng Lin
, Deng-Yi Wang
, Hsiang Chen
, Hsin-Hung Chou
, Shao-Jui Yang
, Yaw-Wen Kuo
, YewChung Sermon Wu
, Yung-Hui Li
, Jung Han

Department of Electrical Engineering

Research output: Contribution to conference › Proceeding

Original language	American English
State	Published - 2024
Event	2024 IEEE International Reliability Physics Symposium (IRPS 2024) - Grapevine, TX, USA Duration: 14 04 2024 → 18 04 2024

Conference

Conference	2024 IEEE International Reliability Physics Symposium (IRPS 2024)
Period	14/04/24 → 18/04/24

Cite this

Hsiao, W.-H., Yang, C.-Y., Chen, C.-S., Lin, C.-F., Wang, D.-Y., Chen, H., Chou, H.-H., Yang, S.-J., Kuo, Y.-W., Wu, Y. S., Li, Y.-H., & Han, J. (2024). Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor. 2024 IEEE International Reliability Physics Symposium (IRPS 2024).

Hsiao, Wei-Han ; Yang, Chun-Yen ; Chen, Cheng-Shan et al. / Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor. 2024 IEEE International Reliability Physics Symposium (IRPS 2024).

@conference{15b47ab169094103b6d83b9c6f1c11e3,

title = "Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor",

author = "Wei-Han Hsiao and Chun-Yen Yang and Cheng-Shan Chen and Chia-Feng Lin and Deng-Yi Wang and Hsiang Chen and Hsin-Hung Chou and Shao-Jui Yang and Yaw-Wen Kuo and Wu, \{YewChung Sermon\} and Yung-Hui Li and Jung Han",

year = "2024",

language = "American English",

note = "2024 IEEE International Reliability Physics Symposium (IRPS 2024) ; Conference date: 14-04-2024 Through 18-04-2024",

}

Hsiao, W-H, Yang, C-Y, Chen, C-S, Lin, C-F, Wang, D-Y, Chen, H, Chou, H-H, Yang, S-J, Kuo, Y-W, Wu, YS, Li, Y-H & Han, J 2024, 'Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor', 2024 IEEE International Reliability Physics Symposium (IRPS 2024), 14/04/24 - 18/04/24.

Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor. / Hsiao, Wei-Han; Yang, Chun-Yen; Chen, Cheng-Shan et al.
2024. 2024 IEEE International Reliability Physics Symposium (IRPS 2024).

Research output: Contribution to conference › Proceeding

TY - CONF

T1 - Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor

AU - Hsiao, Wei-Han

AU - Yang, Chun-Yen

AU - Chen, Cheng-Shan

AU - Lin, Chia-Feng

AU - Wang, Deng-Yi

AU - Chen, Hsiang

AU - Chou, Hsin-Hung

AU - Yang, Shao-Jui

AU - Kuo, Yaw-Wen

AU - Wu, YewChung Sermon

AU - Li, Yung-Hui

AU - Han, Jung

PY - 2024

Y1 - 2024

M3 - Proceeding

T2 - 2024 IEEE International Reliability Physics Symposium (IRPS 2024)

Y2 - 14 April 2024 through 18 April 2024

ER -

Hsiao WH, Yang CY, Chen CS, Lin CF, Wang DY, Chen H et al.. Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano- Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor. 2024. 2024 IEEE International Reliability Physics Symposium (IRPS 2024).