Measurement and simulation of microwave noise transient of InP/InGaAs DHBT with polyimide passivattion

Yong Zhong Xiong*, Geok Ing Ng, Hong Wang, Jeffrey S. Fu, K. Radhakrishnan

*Corresponding author for this work

Research output: Contribution to conferenceConference Paperpeer-review

Abstract

Measurement and simulation of microwave noise transient of InP/InGaAs DHBT with polyimide passivation is reported in this paper for the first time and is believed to contribute to the overall broadband shot noise. This work provides a better insight into the noise transient mechanism of InP HBTs due to polyimide passivation and can be used to improve the device and circuit reliability.

Original languageEnglish
DOIs
StatePublished - 2001
Externally publishedYes
Event2001 31st European Microwave Conference, EuMC 2001 - London, United Kingdom
Duration: 24 09 200126 09 2001

Conference

Conference2001 31st European Microwave Conference, EuMC 2001
Country/TerritoryUnited Kingdom
CityLondon
Period24/09/0126/09/01

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