Abstract
Measurement and simulation of microwave noise transient of InP/InGaAs DHBT with polyimide passivation is reported in this paper for the first time and is believed to contribute to the overall broadband shot noise. This work provides a better insight into the noise transient mechanism of InP HBTs due to polyimide passivation and can be used to improve the device and circuit reliability.
Original language | English |
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DOIs | |
State | Published - 2001 |
Externally published | Yes |
Event | 2001 31st European Microwave Conference, EuMC 2001 - London, United Kingdom Duration: 24 09 2001 → 26 09 2001 |
Conference
Conference | 2001 31st European Microwave Conference, EuMC 2001 |
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Country/Territory | United Kingdom |
City | London |
Period | 24/09/01 → 26/09/01 |