Measurement of manufacturing- and hydrothermal-induced warpages for ACF-bonded COG package in TFT-LCD

M. Y. Tsai, C. Y. Huang, C. W. Ding, Kuo Shu Kao, Ming Yao Chen, Jimmy Tsang, Sheng Shu Yang, Cho Chyun An, Shyh Ming Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The problem with the excessive warpage of COG packages, so-called Mura effect (shadow along the edges of TFT-LCD), is one of major yield or reliability issues encountered in the TFT-LCD industry. To address this problem, the warpages of ACF-bonded COG packages in 45×32 mm TFT-LCD after bonding fabrication, thermal shock and 85°C/85%RH conditions were measured by full-field Twyman-Green interferometry with a sensitivity of 0.316μm/fringe. The full-field warpages(or coplanarity) of ACF-bonded COG packages after bonding, hygro-thermal and thermal cyclic conditions have been documented and discussed in details.

Original languageEnglish
Title of host publicationIDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings
Pages98-101
Number of pages4
StatePublished - 2007
EventInternational Display Manufacturing Conference and Exhibition, IDMC 2007 - Taipei, Taiwan
Duration: 03 07 200706 07 2007

Publication series

NameIDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings

Conference

ConferenceInternational Display Manufacturing Conference and Exhibition, IDMC 2007
Country/TerritoryTaiwan
CityTaipei
Period03/07/0706/07/07

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