Measuring and Characterizing Nanotechnology [The Editors' Desk]

Bing Sheu, Xiaoning Jiang

Research output: Contribution to journal › Journal Editorial

Original language	English
Article number	9328644
Pages (from-to)	2
Number of pages	1
Journal	IEEE Nanotechnology Magazine
Volume	15
Issue number	1
DOIs	https://doi.org/10.1109/MNANO.2020.3037437
State	Published - 02 2021

Access to Document

@article{2aa908c2bf5d427ab530d53f791ac987,

title = "Measuring and Characterizing Nanotechnology [The Editors' Desk]",

author = "Bing Sheu and Xiaoning Jiang",

year = "2021",

month = feb,

doi = "10.1109/MNANO.2020.3037437",

language = "英语",

volume = "15",

pages = "2",

journal = "IEEE Nanotechnology Magazine",

issn = "1932-4510",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1",

}

TY - JOUR

T1 - Measuring and Characterizing Nanotechnology [The Editors' Desk]

AU - Sheu, Bing

AU - Jiang, Xiaoning

PY - 2021/2

Y1 - 2021/2

UR - https://www.scopus.com/pages/publications/85099910648

U2 - 10.1109/MNANO.2020.3037437

DO - 10.1109/MNANO.2020.3037437

M3 - 社论

AN - SCOPUS:85099910648

SN - 1932-4510

VL - 15

SP - 2

JO - IEEE Nanotechnology Magazine

JF - IEEE Nanotechnology Magazine

IS - 1

M1 - 9328644

ER -