Measuring production yield for processes with multiple quality characteristics

W. L. Pearn; F. K. Wang; C. H. Yen

doi:10.1080/00207540600589119

Measuring production yield for processes with multiple quality characteristics

W. L. Pearn
, F. K. Wang^*
, C. H. Yen

^*Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

30 Scopus citations

Abstract

Process yield is an important criterion used in the manufacturing industry for measuring process performance. Methods for measuring yield for processes with single characteristic have been investigated extensively. However, methods for measuring yield for processes with multiple characteristics have been comparatively neglected. In this paper, we develop a generalized yield index, called TS_pk,PC, based on the index S_pk introduced by Boyles (Journal of Quality Technology, 23, 17-26, 1991) using the principal component analysis (PCA) technique. We obtained a lower confidence bound (LCB) for the true process yield. The proposed method can be used to determine whether a process meets the preset yield requirement, and make reliable decisions. Examples are provided to demonstrate the proposed methodology.

Original language	English
Pages (from-to)	4649-4661
Number of pages	13
Journal	International Journal of Production Research
Volume	44
Issue number	21
DOIs	https://doi.org/10.1080/00207540600589119
State	Published - 01 11 2006
Externally published	Yes

Keywords

Lower confidence bound
Principal component analysis
Process capability indices
Process yield

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1080/00207540600589119

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title = "Measuring production yield for processes with multiple quality characteristics",

abstract = "Process yield is an important criterion used in the manufacturing industry for measuring process performance. Methods for measuring yield for processes with single characteristic have been investigated extensively. However, methods for measuring yield for processes with multiple characteristics have been comparatively neglected. In this paper, we develop a generalized yield index, called TSpk,PC, based on the index Spk introduced by Boyles (Journal of Quality Technology, 23, 17-26, 1991) using the principal component analysis (PCA) technique. We obtained a lower confidence bound (LCB) for the true process yield. The proposed method can be used to determine whether a process meets the preset yield requirement, and make reliable decisions. Examples are provided to demonstrate the proposed methodology.",

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T1 - Measuring production yield for processes with multiple quality characteristics

AU - Pearn, W. L.

AU - Wang, F. K.

AU - Yen, C. H.

PY - 2006/11/1

Y1 - 2006/11/1

N2 - Process yield is an important criterion used in the manufacturing industry for measuring process performance. Methods for measuring yield for processes with single characteristic have been investigated extensively. However, methods for measuring yield for processes with multiple characteristics have been comparatively neglected. In this paper, we develop a generalized yield index, called TSpk,PC, based on the index Spk introduced by Boyles (Journal of Quality Technology, 23, 17-26, 1991) using the principal component analysis (PCA) technique. We obtained a lower confidence bound (LCB) for the true process yield. The proposed method can be used to determine whether a process meets the preset yield requirement, and make reliable decisions. Examples are provided to demonstrate the proposed methodology.

AB - Process yield is an important criterion used in the manufacturing industry for measuring process performance. Methods for measuring yield for processes with single characteristic have been investigated extensively. However, methods for measuring yield for processes with multiple characteristics have been comparatively neglected. In this paper, we develop a generalized yield index, called TSpk,PC, based on the index Spk introduced by Boyles (Journal of Quality Technology, 23, 17-26, 1991) using the principal component analysis (PCA) technique. We obtained a lower confidence bound (LCB) for the true process yield. The proposed method can be used to determine whether a process meets the preset yield requirement, and make reliable decisions. Examples are provided to demonstrate the proposed methodology.

KW - Lower confidence bound

KW - Principal component analysis

KW - Process capability indices

KW - Process yield

UR - https://www.scopus.com/pages/publications/33748680697

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DO - 10.1080/00207540600589119

M3 - 文章

AN - SCOPUS:33748680697

SN - 0020-7543

VL - 44

SP - 4649

EP - 4661

JO - International Journal of Production Research

JF - International Journal of Production Research

IS - 21

ER -

Measuring production yield for processes with multiple quality characteristics

Abstract

Keywords

UN SDGs

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