Measuring the process yield for circular profiles

Fu Kwun Wang*

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

7 Scopus citations

Abstract

Two indices Cp(circular) and Cpk(circular) based on the functional method have been proposed to measure the process capability of circular profiles. However, these two indices only provide potential capability and a lower bound on the process yield, respectively. In this paper, we develop a new yield index Spk(circular) for circular profiles. This index provides an exact measure of process yield. The asymptotic normal distribution of the estimated index is derived. The statistical inferences such as hypothesis testing, confidence interval, and lower confidence interval can be easily constructed. A simulation study is conducted to assess the performance of the proposed method. The simulation results confirm that the estimates are close to the true value and the coverage rates of the confidence intervals are greater than the 95% lower limit of the stated nominal in most cases. One real data set is used to illustrate the applicability of the proposed method.

Original languageEnglish
Pages (from-to)579-588
Number of pages10
JournalQuality and Reliability Engineering International
Volume31
Issue number4
DOIs
StatePublished - 01 06 2015
Externally publishedYes

Bibliographical note

Publisher Copyright:
Copyright © 2013 John Wiley & Sons, Ltd.

Keywords

  • circular profiles
  • lower confidence bound
  • process yield

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