Abstract
ZrNx thin films were deposited on silicon substrates using novel high-power impulse magnetron sputtering. The films were annealed at 600 °C in an atmosphere of 15 ppm O2-N2, and their performance as a protective hard coating on glass molding dies was evaluated. The as-deposited ZrNx thin films were characterized by a high nanohardness of 26-27 GPa and low surface roughness of approximately 0.5 nm. However, the mechanical properties of the ZrNx thin films declined after they were annealed owing to the formation of ZrO2 scales.
| Original language | English |
|---|---|
| Article number | 02D107 |
| Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| Volume | 34 |
| Issue number | 2 |
| DOIs | |
| State | Published - 01 03 2016 |
Bibliographical note
Publisher Copyright:© 2016 American Vacuum Society.
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