Metal on Graphenated Metal for VLSI Interconnects

  • Udit Narula
  • , Cher Ming Tan*
  • , Eng Soon Tok
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

3 Scopus citations

Abstract

Copper is running out of steam for modern very large scale integration (VLSI) technology and therefore there is a need for paradigm shift to a more reliable interconnect structure. Metal–graphene–metal structure is suggested to be a suitable candidate. A new method is devised wherein graphene synthesized on copper foil can act as a reducing agent for electroless plating of copper without the need of any other chemical species, making such novel interconnect structure feasible in practice. The superiority of such interconnect structure can be seen both experimentally and simulationally. Such deposition is also possible for synthesized or transferred graphene on other metals such as nickel, titanium, aluminum, gold, silver, cobalt, palladium, having metal–graphene interface separation of less than 3.2–3.6 Å as derived from its fundamental principle.

Original languageEnglish
Article number1800270
JournalAdvanced Materials Interfaces
Volume5
Issue number13
DOIs
StatePublished - 09 07 2018

Bibliographical note

Publisher Copyright:
© 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Keywords

  • charge transfer
  • chemical vapor deposition graphene
  • electroless deposition

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