Abstract
A K-band second-order bandpass filter with planar inductive π-network using CMOS technology is demonstrated for the first time. To reduce the substrate loss of the filter, the CMOS process compatible backside inductively-coupled-plasma (ICP) deep trench technology is used to selectively remove the silicon underneath the filter. After the ICP etching, a 55.5-92.2 improvement in quality factor is achieved for the inductors in the filter. In addition, a 1.1dB improvement in maximum available power gain (G Amax) in K-band is achieved for the filter after the ICP etching. These results show that the micromachined π (PI) filter is very promising for microwave/millimetre-wave RFIC applications.
Original language | English |
---|---|
Pages (from-to) | 398-399 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 43 |
Issue number | 7 |
DOIs | |
State | Published - 2007 |
Externally published | Yes |