Micromachined 22 GHz PI filter by CMOS compatible ICP deep trench technology

T. Wang*, Y. S. Lin, S. S. Lu

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

10 Scopus citations

Abstract

A K-band second-order bandpass filter with planar inductive π-network using CMOS technology is demonstrated for the first time. To reduce the substrate loss of the filter, the CMOS process compatible backside inductively-coupled-plasma (ICP) deep trench technology is used to selectively remove the silicon underneath the filter. After the ICP etching, a 55.5-92.2 improvement in quality factor is achieved for the inductors in the filter. In addition, a 1.1dB improvement in maximum available power gain (G Amax) in K-band is achieved for the filter after the ICP etching. These results show that the micromachined π (PI) filter is very promising for microwave/millimetre-wave RFIC applications.

Original languageEnglish
Pages (from-to)398-399
Number of pages2
JournalElectronics Letters
Volume43
Issue number7
DOIs
StatePublished - 2007
Externally publishedYes

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