Microstructural analysis and optoelectrical properties of Cu2O, Cu2O-Ag, and Cu2O/Ag2O multilayered nanocomposite thin films

C. C. Tseng; J. H. Hsieh; W. Wu

doi:10.1016/j.tsf.2011.01.081

Microstructural analysis and optoelectrical properties of Cu₂O, Cu₂O-Ag, and Cu₂O/Ag₂O multilayered nanocomposite thin films

C. C. Tseng
, J. H. Hsieh
, W. Wu^*

^*Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

28 Scopus citations

Abstract

Cu₂O, Cu₂O-Ag nanocomposite, and Cu ₂O/Ag₂O multilayered thin films were prepared by DC-reactive magnetron sputtering on glass substrates. After deposition, the microstructure of the films was examined using X-ray diffractometry and transmission electron microscopy (TEM). An incident-photon-conversion-efficiency (IPCE) system was used to characterize the opto-electrical properties of these films. The TEM study reveals that Cu₂O-Ag nanocomposite consists of Cu₂O, Ag₂O, and small amount of Ag phases. The coupling of the Ag₂O phase with Cu₂O can enhance light absorption and create more electron-hole pairs due to the small band gap of Ag₂O. Furthermore, the composite band structure can cause the increased carrier density by enhancing electron-hole separation. The multilayered Cu ₂O/Ag₂O films also show similar results to Cu ₂O-Ag although not as outstanding.

Original language	English
Pages (from-to)	5169-5173
Number of pages	5
Journal	Thin Solid Films
Volume	519
Issue number	15
DOIs	https://doi.org/10.1016/j.tsf.2011.01.081
State	Published - 31 05 2011
Externally published	Yes

Keywords

Cu O-Ag nanocomposite
CuO/AgO multilayer thin films
IPCE
Multilayer thin films
Opto-electrical properties
Opto-electronic properties
TEM

Access to Document

10.1016/j.tsf.2011.01.081

Cite this

@article{8e8de0ad42204821b30d51465ef8a098,

title = "Microstructural analysis and optoelectrical properties of Cu2O, Cu2O-Ag, and Cu2O/Ag2O multilayered nanocomposite thin films",

abstract = "Cu2O, Cu2O-Ag nanocomposite, and Cu 2O/Ag2O multilayered thin films were prepared by DC-reactive magnetron sputtering on glass substrates. After deposition, the microstructure of the films was examined using X-ray diffractometry and transmission electron microscopy (TEM). An incident-photon-conversion-efficiency (IPCE) system was used to characterize the opto-electrical properties of these films. The TEM study reveals that Cu2O-Ag nanocomposite consists of Cu2O, Ag2O, and small amount of Ag phases. The coupling of the Ag2O phase with Cu2O can enhance light absorption and create more electron-hole pairs due to the small band gap of Ag2O. Furthermore, the composite band structure can cause the increased carrier density by enhancing electron-hole separation. The multilayered Cu 2O/Ag2O films also show similar results to Cu 2O-Ag although not as outstanding.",

keywords = "Cu O-Ag nanocomposite, CuO/AgO multilayer thin films, IPCE, Multilayer thin films, Opto-electrical properties, Opto-electronic properties, TEM",

author = "Tseng, \{C. C.\} and Hsieh, \{J. H.\} and W. Wu",

year = "2011",

month = may,

day = "31",

doi = "10.1016/j.tsf.2011.01.081",

language = "英语",

volume = "519",

pages = "5169--5173",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

number = "15",

}

TY - JOUR

T1 - Microstructural analysis and optoelectrical properties of Cu2O, Cu2O-Ag, and Cu2O/Ag2O multilayered nanocomposite thin films

AU - Tseng, C. C.

AU - Hsieh, J. H.

AU - Wu, W.

PY - 2011/5/31

Y1 - 2011/5/31

N2 - Cu2O, Cu2O-Ag nanocomposite, and Cu 2O/Ag2O multilayered thin films were prepared by DC-reactive magnetron sputtering on glass substrates. After deposition, the microstructure of the films was examined using X-ray diffractometry and transmission electron microscopy (TEM). An incident-photon-conversion-efficiency (IPCE) system was used to characterize the opto-electrical properties of these films. The TEM study reveals that Cu2O-Ag nanocomposite consists of Cu2O, Ag2O, and small amount of Ag phases. The coupling of the Ag2O phase with Cu2O can enhance light absorption and create more electron-hole pairs due to the small band gap of Ag2O. Furthermore, the composite band structure can cause the increased carrier density by enhancing electron-hole separation. The multilayered Cu 2O/Ag2O films also show similar results to Cu 2O-Ag although not as outstanding.

AB - Cu2O, Cu2O-Ag nanocomposite, and Cu 2O/Ag2O multilayered thin films were prepared by DC-reactive magnetron sputtering on glass substrates. After deposition, the microstructure of the films was examined using X-ray diffractometry and transmission electron microscopy (TEM). An incident-photon-conversion-efficiency (IPCE) system was used to characterize the opto-electrical properties of these films. The TEM study reveals that Cu2O-Ag nanocomposite consists of Cu2O, Ag2O, and small amount of Ag phases. The coupling of the Ag2O phase with Cu2O can enhance light absorption and create more electron-hole pairs due to the small band gap of Ag2O. Furthermore, the composite band structure can cause the increased carrier density by enhancing electron-hole separation. The multilayered Cu 2O/Ag2O films also show similar results to Cu 2O-Ag although not as outstanding.

KW - Cu O-Ag nanocomposite

KW - CuO/AgO multilayer thin films

KW - IPCE

KW - Multilayer thin films

KW - Opto-electrical properties

KW - Opto-electronic properties

KW - TEM

UR - https://www.scopus.com/pages/publications/79957661126

U2 - 10.1016/j.tsf.2011.01.081

DO - 10.1016/j.tsf.2011.01.081

M3 - 文章

AN - SCOPUS:79957661126

SN - 0040-6090

VL - 519

SP - 5169

EP - 5173

JO - Thin Solid Films

JF - Thin Solid Films

IS - 15

ER -

Microstructural analysis and optoelectrical properties of Cu₂O, Cu₂O-Ag, and Cu₂O/Ag₂O multilayered nanocomposite thin films

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this