Microwave noise performance of metamorphic InP/In0.53Ga0.47As/InP DHBT on GaAs substrates

  • Yong Zhong Xiong*
  • , Geok Ing Ng
  • , Hong Wang
  • , Jeffrey S. Fu
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

Abstract

The microwave noise performances of metamorphic (MM) InP/In0.53Ga0.47As/InP double-heterojunction bipolar transistors (DHBTs) on GaAs substrate are investigated for the first time. The noise figures and associated gains of the device with an emitter size of 5 × 5 μm2 are studied in the frequency range of 2-10 GHz. The variations of minimum noise figure at different collector currents are presented. At 2 GHz, the best minimum noise figure (FMIN) of 2.1 dB with an associated gain (GASS) of 12.7 dB have been achieved at VCE = 1.5 V and IC = 0.3 mA (1.2 kA/cm2). For comparable size and current density, these results show noise performance comparable to those of reported lattice-matched InP HBT at lower frequency (∼2 GHz).

Original languageEnglish
Pages (from-to)306-308
Number of pages3
JournalMicrowave and Optical Technology Letters
Volume33
Issue number4
DOIs
StatePublished - 20 05 2002
Externally publishedYes

Keywords

  • DHBT
  • F
  • GaAs
  • HBT
  • InP/InGaAs
  • Metamorphic
  • Noise
  • Noise figure

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