@inproceedings{3982a859297c473288ca359ee5170912,
title = "Multi-function controller for low-power multiple scan test of transition delay faults",
abstract = "Low-power testing is very important in the production process of integrated circuits. In this paper, we design a multifunction controller for a special low-power multiple scan test architecture. The controller can make the multiple scan chains be shifted in segment by segment and only one segment for each scan chain is launched or captured for testing transition delay faults. Either launch-off-shift (LOS) or launch-off-capture (LOC) test application can be performed via the operation of the controller. Only test patterns and simple control signals need to be prepared for testers to achieve the required low-power testing.",
keywords = "launch-off-capture, launch-off-shift, transition delay fault and multiple scan chains",
author = "Liang, \{Hsing Chung\} and Ho, \{Chang Jung\}",
year = "2014",
doi = "10.1109/ISNE.2014.6839366",
language = "英语",
isbn = "9781479947805",
series = "2014 International Symposium on Next-Generation Electronics, ISNE 2014",
publisher = "IEEE Computer Society",
booktitle = "2014 International Symposium on Next-Generation Electronics, ISNE 2014",
address = "美国",
note = "3rd International Symposium on Next-Generation Electronics, ISNE 2014 ; Conference date: 07-05-2014 Through 10-05-2014",
}