Multiple Comparisons with the Best for Process Selection for Linear Profiles with One-sided Specifications

  • Fu Kwun Wang*
  • , Yeneneh Tamirat
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

3 Scopus citations

Abstract

In this study, we propose the multiple comparisons with the best method based on the yield index to compare the process yields of K (K ≥ 2) suppliers for linear profiles with one-sided specifications. The performance analysis of the proposed method is conducted. The numbers of profiles required for different power levels are also provided. A simulated data set from a leather dyeing process is presented to illustrate the applicability of the proposed method.

Original languageEnglish
Pages (from-to)697-704
Number of pages8
JournalQuality and Reliability Engineering International
Volume32
Issue number2
DOIs
StatePublished - 01 03 2016
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2015 John Wiley & Sons, Ltd.

Keywords

  • linear profiles
  • multiple comparisons with the best
  • process selection
  • process yield

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