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Negative resistance characterisation and defective trap exploration in ZnO nonvolatile memory devices

  • Fu Chien Chiu*
  • , Chih Yao Huang
  • , Wen Yuan Chang
  • , Tung Ming Pan
    • *Corresponding author for this work
  • Ming Chuan University
  • Chien Hsin University of Science and Technology
  • National Tsing Hua University

Research output: Contribution to journal › Journal Article › peer-review

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