Abstract
In this study, a novel metal-semiconductor gate enhancement-mode (E-mode) and a metal-insulator-metal-semiconductor (MIMS) gate depletion-mode (D-mode) AlGaAs/InGaAs pseudomorphic high electron mobility transistor (pHEMT) on a single GaAs substrate have been developed by using high dielectric constant praseodymium insulator layer. The epitaxial layers were design for an enhancement-mode pHEMT after gate recess process. To achieve E/D-mode pHEMTs on single GaAs wafer, traditional Pt/Ti/Au metals were deposited as Schottky contact for E-mode pHEMTs and Pr/Pr 2O 3/Ti/Au were deposited as MIMS-gate for D-mode pHEMTs. This AlGaAs/InGaAs E-mode pHEMTs exhibit a gate turn-on voltage (V ON) of +1 V and a gate-to-drain breakdown voltage of -5.6 V, and these values were +7 V and -34 V for MIMS-gate D-mode pHEMTs, respectively. Therefore, this high-k insulator in D-mode pHEMT is beneficial for suppressing the gate leakage current. Comparing to previous E/D-mode pHEMT technology, this E-mode pHEMTs and MIMS-gate D-mode pHEMTs exhibit a highly potential for high uniformity GaAs logic circuit applications due to its single recess process.
Original language | English |
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Pages (from-to) | 147-150 |
Number of pages | 4 |
Journal | Microelectronics Reliability |
Volume | 52 |
Issue number | 1 |
DOIs | |
State | Published - 01 2012 |