NTIRE 2022 Challenge on Stereo Image Super-Resolution: Methods and Results

Yulan Guo, Longguang Wang, Yingqian Wang, Juncheng Li, Shuhang Gu, Radu Timofte, Liangyu Chen, Xiaojie Chu, Wenqing Yu, Kai Jin, Zeqiang Wei, Sha Guo, Angulia Yang, Xiuzhuang Zhou, Guodong Guo, Bin Dai, Feiyue Peng, Huaxin Xiao, Shen Yan, Yuxiang LiuHanxiao Cai, Pu Cao, Yang Nie, Lu Yang, Qing Song, Xiaotao Hu, Jun Xu, Mai Xu, Junpeng Jing, Xin Deng, Qunliang Xing, Minglang Qiao, Zhenyu Guan, Wenlong Guo, Chenxu Peng, Zan Chen, Junyang Che, Hao Li, Junbin Chen, Weijie Li, Zhijing Yang, Gen Li, Aijin Li, Lei Sun, Dafeng Zhang, Shizhuo Liu, Jiangtao Zhang, Yanyun Qu, Hao Hsiang Yang, Zhi Kai Huang, Wei Ting Chen, Hua En Chang, Sy Yen Kuo, Qiaohui Liang, Jianxin Lin, Yijun Wang, Lianying Yin, Rongju Zhang, Wei Zhao, Peng Xiao, Rongjian Xu, Zhilu Zhang, Wangmeng Zuo, Hansheng Guo, Guangwei Gao, Tieyong Zeng, Joohyeok Kim, Hyeon A. Kim, Eunpil Park, Jae Young Sim, Huicheng Pi, Shunli Zhang, Jucai Zhai, Pengcheng Zeng, Yang Liu, Chihao Ma, Yulin Huang, Junying Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

32 Scopus citations

Abstract

In this paper, we summarize the 1st NTIRE challenge on stereo image super-resolution (restoration of rich details in a pair of low-resolution stereo images) with a focus on new solutions and results. This challenge has 1 track aiming at the stereo image super-resolution problem under a standard bicubic degradation. In total, 238 participants were successfully registered, and 21 teams competed in the final testing phase. Among those participants, 20 teams successfully submitted results with PSNR (RGB) scores better than the baseline. This challenge establishes a new benchmark for stereo image SR.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
PublisherIEEE Computer Society
Pages905-918
Number of pages14
ISBN (Electronic)9781665487399
DOIs
StatePublished - 2022
Externally publishedYes
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States
Duration: 19 06 202220 06 2022

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2022-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2220/06/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

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