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OBDD-based evaluation of k-terminal network reliability

  • Fu Min Yeh*
  • , Shyue Kung Lu
  • , Sy Yen Kuo
  • *Corresponding author for this work
  • Chung-shan Institute of Science and Technology Taiwan
  • Fu Jen Catholic University
  • IEEE
  • National Taiwan University

Research output: Contribution to journalJournal Article peer-review

99 Scopus citations

Abstract

An efficient approach to determining the reliability of an undirected k-terminal network based on 2-terminal reliability functions is presented. First, a feasible set of (k - 1) terminal-pairs is chosen, and the 2-terminal reliability functions of the (k - 1) terminal-pairs are generated based on the edge expansion diagram using an OBDD (ordered binary decision diagram). Then the k-terminal reliability function can be efficiently constructed by combining these (k - 1) reliability expressions with the Boolean and operation. Because building 2-terminal reliability functions and reducing redundant computations by merging reliability functions can be done very efficiently, the proposed approaches are much faster than those which directly expand the entire network or directly factor the k-terminal networks. The effectiveness of this approach is demonstrated by performing experiments on several large benchmark networks. An example of appreciable improvement is that the evaluation of the reliability of a source-terminal 3 × 10 all-terminal network took only 2.4 seconds on a SPARC 20 workstation. This is much faster than previous factoring-algorithms.

Original languageEnglish
Pages (from-to)443-451
Number of pages9
JournalIEEE Transactions on Reliability
Volume51
Issue number4
DOIs
StatePublished - 12 2002
Externally publishedYes

Keywords

  • Factoring
  • Network reduction
  • Network reliability
  • Ordered Binary Decision Diagram (OBDD)
  • Terminal-pair reliability

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