OBDD-based network reliability calculation

Fu Min Yeh, Sy Yen Kuo*

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

15 Scopus citations

Abstract

An efficient method for evaluating the terminal-pair reliability based on an edge expansion tree and using an OBDD (ordered binary decision diagram) is presented. The effectiveness of the algorithm is demonstrated on the larger benchmarks collected in previous work. One notable case of the experimental results for a 2 × 20 lattice network is that the number of nodes in the OBDD is linearly proportional to the number of stages. This is significantly superior to previous algorithms which are based on the sum of disjoint products and has exponential complexity.

Original languageEnglish
Pages (from-to)759-760
Number of pages2
JournalElectronics Letters
Volume33
Issue number9
DOIs
StatePublished - 24 04 1997
Externally publishedYes

Keywords

  • Reliability theory

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