Optimal Estimation of Diffusion in DW-MRI by High-Order MRF-Based Joint Deformable Registration and Diffusion Modeling

  • Evgenios N. Kornaropoulos
  • , Evangelia I. Zacharaki
  • , Pierre Zerbib
  • , Chieh Lin
  • , Alain Rahmouni
  • , Nikos Paragios

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Over the last years, the apparent diffusion coefficient (ADC), computed from diffusion-weighted magnetic resonance (DW-MR) images, has become an important imaging biomarker for evaluating and managing patients with neoplastic or cerebrovascular disease. Standard methods for the calculation of ADC ignore the presence of noise and motion between successive (in time) DW-MR images acquired by changing the b-value. In order to accurately quantify the diffusion process during image acquisition, we introduce a method based on a high-order Markov Random Field (MRF) formulation that jointly registers the DWMR images and models the spatiotemporal diffusion. Spatial smoothness on the ADC map, as well as spatiotemporal deformation smoothness, is imposed towards producing anatomically meaningful representations. The high-order dependencies in our MRF model are handled through Dual Decomposition. Performance of registration is compared to a state-of-the art registration approach in terms of obtained fitting error of the diffusion model in the core of the tumor. Preliminary results reveal a marginally better performance of our method when compared against the standard ADC map used in clinical practice, which indicates its potential as a means for extracting imaging biomarkers.

Original languageEnglish
Title of host publicationProceedings - 29th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2016
PublisherIEEE Computer Society
Pages618-625
Number of pages8
ISBN (Electronic)9781467388504
DOIs
StatePublished - 16 12 2016
Externally publishedYes
Event29th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2016 - Las Vegas, United States
Duration: 26 06 201601 07 2016

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference29th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2016
Country/TerritoryUnited States
CityLas Vegas
Period26/06/1601/07/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

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