Optimal parameter design in flip chip micro-machining process for solder residue by using design of experiments approach

Jian Long Kuo*, Chun Cheng Kuo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Since the solder residue is essential in the semiconductor manufacturing process, it has great impact on the flip chip quality considerably. This paper intends to improve the flip chip quality and try to obtain an optimal solution for the system parameters in the flip chip manufacturing process. The SMT manufacturing process is studied for discussion. The amount of solder and the size of solder are selected as the two quality properties. During the flux cleaning process, many solders are left on the passive component side. The balling might flow into the chip. It will cause the bump short in the chip which will affect the quality of the flip chip severely. In this paper, response surface method is adopted as the design of experiments. The objective function and subjective constrained conditions are defined to formulate the optimization problem. The confirmation experimental results are also provided to prove the validity. It is believed that the optimization results are helpful to the improvement of the semiconductor manufacturing process

Original languageEnglish
Title of host publicationAdvances in Abrasive Technology XIII
Pages867-872
Number of pages6
DOIs
StatePublished - 2010
Externally publishedYes
Event13th International Symposium on Advances in Abrasive Technology, ISAAT2010 - Taipei, Taiwan
Duration: 19 09 201022 09 2010

Publication series

NameAdvanced Materials Research
Volume126-128
ISSN (Print)1022-6680

Conference

Conference13th International Symposium on Advances in Abrasive Technology, ISAAT2010
Country/TerritoryTaiwan
CityTaipei
Period19/09/1022/09/10

Keywords

  • Design of Experiments (DOE) method
  • Response surface method
  • Solder bead
  • Solder residue

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