Abstract
In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.
| Original language | English |
|---|---|
| Pages (from-to) | 771-773 |
| Number of pages | 3 |
| Journal | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
| Volume | E83-A |
| Issue number | 4 |
| State | Published - 2000 |
| Externally published | Yes |
Keywords
- Analog circuit
- Built-in self-test (BIST)
- Fault diagnosis
- Operational transconductance amplifier (OTA)
- Testing