Over Temperature Protection Circuits for Integrated Power Converters

Deng Fong Lu, Chin Hsia

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Integrated power converters suffer from overheating when they operate under extreme conditions. To prevent destructive breakdown an over-temperature protection (OTP) circuit is usually designed along with circuits, which restricts the chip temperature within a threshold level. From a design standpoint, OTP output should vary within a limit range throughout the whole process corners in order to support the chip's reliability. The paper presents an OTP circuit design to limit fluctuations in triggering and reset points by reducing the comparator errors. Simulated results revealed the designed OTP circuit can reach less than 10 % variation over 300 different corners.

Original languageEnglish
Title of host publication2018 IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781538663011
DOIs
StatePublished - 27 08 2018
Externally publishedYes
Event5th IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2018 - Taichung, Taiwan
Duration: 19 05 201821 05 2018

Publication series

Name2018 IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2018

Conference

Conference5th IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2018
Country/TerritoryTaiwan
CityTaichung
Period19/05/1821/05/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

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