Particle size and morphology of iridium oxide nanocrystals in non-volatile memory device

Wei Chih Li, Writam Banerjee, Siddheswar Maikap, Jer Ren Yang*

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

4 Scopus citations

Abstract

The aim of this work is to investigate the particle size and morphology of the nanocrystals in the non-volatile memory device by annular dark field (ADF) scanning transmission electron microscopy (STEM) and conventional transmission electron microscopy (CTEM) techniques. With respect to TEM investigation, statistical analysis on STEM image can acquire the size and density of nanocrystals more accurately than on TEM image. In addition, ADF STEM images successfully provide powerful evidences revealing the structure of IrO., nanocrystals as a core shell structure, where the inner structure is rich in Ir and the outer area is abundant in O or Al. This method could be one of the efficient way for examining the nanocrystals with a complicated cored structure.

Original languageEnglish
Pages (from-to)331-335
Number of pages5
JournalMaterials Transactions
Volume52
Issue number3
DOIs
StatePublished - 03 2011

Keywords

  • Core shell structure
  • Iridium oxide nanocrystals
  • Morphology
  • Non-volatile memory device
  • Particle size
  • Scanning transmission electron microscopy

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