Phase-noise improvement of GaAs pHEMT K-band voltage-controlled oscillator using tunable field-plate voltage technology

  • Hsien Chin Chiu*
  • , Chien Cheng Wei
  • , Chia Shih Cheng
  • , Yu Fei Wu
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

3 Scopus citations

Abstract

This letter presents a voltage-controlled oscillator (VCO) with low phase-noise performance by applying tunable field-plate (FP) voltage on 0.15-μm-gate-length GaAs pseudomorphic high-electron-mobility transistors (pHEMTs). In this letter, the FP metal between gate and drain terminals was connected to a single pad and was controlled by an extra voltage supplier VFP. Owing to the depth modulation of FP-induced depletion region at various FP voltages, the device flicker noise was also improved by applying negative VFP. This technique is convenient to be applied in standard pHEMT fabrication and particularly attractive for reducing the phase noise of VCO design without extra power consumption. A tunable phase-noise inductor-capacitor feedback 21-GHz VCO was demonstrated. The measured phase noise of this novel design is -95 dBc/Hz at an offset frequency of 1 MHz, and this value can be improved to -99.6 dBc/Hz at VFP of -5.5 V. The core dc-power consumption of this circuit is 30.8 mW.

Original languageEnglish
Pages (from-to)426-429
Number of pages4
JournalIEEE Electron Device Letters
Volume29
Issue number5
DOIs
StatePublished - 05 2008

Keywords

  • Field-plate (FP)
  • Flicker noise
  • Phase noise
  • Pseudomorphic high-electron-mobility transistor (pHEMT)
  • Voltage-controlled oscillator (VCO)

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