Abstract
Copper-zinc-indium-sulfide (Cu-Zn-In-S) semiconductor films are deposited onto fluorine-doped-tin-oxide-coated glass substrates using one-step electrodeposition. The effect of the [Zn]/[Cu + Zn] molar ratio in the solution bath on the structural, optical, and electrical properties of samples is investigated. X-ray diffraction patterns reveal that the samples are the quaternary Cu-In-Zn-S phase with a small amount of ZnS impurity. The thicknesses and direct band gaps of the samples, determined from surface profile measurements and transmittance and reflectance spectra, are in the ranges of 0.68-2.09 μm and 1.43-3.03 eV, respectively. The flat-band potentials of the samples obtained from Mott-Schottky measurements are the range of -1.03 to -1.44 V vs. an Ag/AgCl reference electrode. All samples are n-type semiconductors with a carrier density of 8.4 × 1015 to 2.0 × 10 14 cm-3 and a mobility of 96-263 cm2 V -1 s-1. The samples with the Cu:Zn:In:S molar ratio of 1:1.08:2.16:5.20 had a maximum photo-enhanced current density of 1.50 mA cm -2 at an applied bias of -0.25 V vs. an Ag/AgCl electrode in contact with an electrolyte containing Na2S and K2SO3 under illumination. The results show that Cu-Zn-In-S films can be obtained using one-step electrodeposition for photoelectrochemical applications.
Original language | English |
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Pages (from-to) | 53-62 |
Number of pages | 10 |
Journal | Electrochimica Acta |
Volume | 87 |
DOIs | |
State | Published - 01 01 2013 |
Keywords
- Copper-zinc-indium-sulfide
- Electrodeposition
- Photoelectrochemical
- Thin film