Polarized differential-phase laser scanning microscope

Chien Chou, Chung Wei Lyu, Li Cheng Peng

Research output: Contribution to journalJournal Article peer-review

31 Scopus citations

Abstract

A polarized differential–phase laser scanning microscope, which combines a polarized optical heterodyne Mach–Zehnder interferometer and a differential amplifier to scan the topographic image of a surface, is proposed. In the experiment the differential amplifier, which acts as a PM–AM converter in the experiment, converting phase modulation (PM) into amplitude modulation (AM). Then a novel, to our knowledge, phase demodulator was proposed and implemented for the differential–phase laser scanning microscope. An optical grating (1800 lpymm) was imaged. The lateral and the depth resolutions of the imaging system were 0.5 mm and 1 nm, respectively. The detection accuracy, which was limited by the reflectivity variation of the test surface, is discussed.

Original languageEnglish
Pages (from-to)95-99
Number of pages5
JournalApplied Optics
Volume40
Issue number1
DOIs
StatePublished - 01 01 2001
Externally publishedYes

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