Abstract
In this study, Pre-diagnosis of degraded aluminum indium gallium phosphide (AlInGaP) light-emitting diodes (LEDs) that were soaked in liquid nitrogen (LN2) was performed. To visualize the early deterioration of LED emission, a combination of material, electrical, optical, and computer-aided machine-vision analysis of LED failure spots on the surface was examined. Results indicate that several small failure spots, which can be identified by the MATLAB processed emission images and surface roughness variation, can be found. Furthermore, LN2 soaking induced some local damages inside the device that penetrate the multiple-quantum well. The decrease of current and luminescence intensity also reflects the gradual degradation of the device after being soaked in LN2. This integrated analysis and Pre-diagnosis of the degraded device provided early screening of LED failure spots and real-time inspection during operations.
Original language | English |
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Pages (from-to) | 4386-4391 |
Number of pages | 6 |
Journal | IEEE Transactions on Electron Devices |
Volume | 69 |
Issue number | 8 |
DOIs | |
State | Published - 01 08 2022 |
Bibliographical note
Publisher Copyright:© 1963-2012 IEEE.
Keywords
- Aluminum indium gallium phosphide (AlInGaP) light-emitting diode (LED)
- computer vision
- damages
- failure spots
- liquid nitrogen (LN-)
- pre-diagnosis