Abstract
In this paper, we have combined a Mach-Zehnder interferometer and an optical heterodyne using an AO modulator to set up an interferometric ellipsometer for measuring the optical properties of metal surfaces. Because there is no moving mechanism, e.g., compensators and quarterwave plates, we can eliminate the errors caused by these elements. By using a phase lock-in technique and computer processing, we can measure parameters ψ and ∆ in real time and with great accuracy (where ’k is the amplitude ratio of the P- and S-waves, and ∆ is the phase difference in the P- and S-waves).
Original language | English |
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Pages (from-to) | 5159-5162 |
Number of pages | 4 |
Journal | Applied Optics |
Volume | 29 |
Issue number | 34 |
DOIs | |
State | Published - 12 1990 |
Externally published | Yes |